Tag: Error

Defects, Errors, and Faults

In Electronics industry incorrectness in products are described in several ways which may create confusion in understanding the terms defect, error and fault. Though these terms are used interchangeably in the field of VLSI testing, let’s try to draw a…

Need of Fault Tolerant VLSI System Design

In recent few years VLSI design has achieved remarkable growth. High performance (peta-scale) computing is a reality now and we are expecting exa-scale computing by 2020. We talk about many core processor now a days. Intel’s Xeon Phi (Knights Landing)…